发明申请
- 专利标题： DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD
- 专利标题（中）： 缺陷检查装置和缺陷检查方法
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申请号： US12823510申请日： 2010-06-25
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公开(公告)号： US20100259751A1公开(公告)日： 2010-10-14
- 发明人: Sachio UTO , Minori NOGUCHI , Hidetoshi NISHIYAMA , Yoshimasa OHSHIMA , Akira HAMAMATSU , Takahiro JINGU , Toshihiko NAKATA , Masahiro WATANABE
- 申请人： Sachio UTO , Minori NOGUCHI , Hidetoshi NISHIYAMA , Yoshimasa OHSHIMA , Akira HAMAMATSU , Takahiro JINGU , Toshihiko NAKATA , Masahiro WATANABE
- 优先权： JP2002-344327 20021127
- 主分类号： G01N21/00
- IPC分类号： G01N21/00
摘要：
An inspecting apparatus and method including first and second illuminating units for illuminating a surface of a specimen to be inspected with different incident angles and first and second detecting optical units arranged at different elevation angle directions to the surface of the specimen for detecting images of the specimen illuminated by the first and second illuminating units.
公开/授权文献
- US08013989B2 Defects inspecting apparatus and defects inspecting method 公开/授权日：2011-09-06
信息查询
