发明申请
US20100281981A1 CHARACTERIZATION WITH PICOSECOND ULTRASONICS OF METAL PORTIONS OF SAMPLES POTENTIALLY SUBJECT TO EROSION
有权
表征可能潜在腐蚀的样品金属部分的PICOSECOND超声波
- 专利标题: CHARACTERIZATION WITH PICOSECOND ULTRASONICS OF METAL PORTIONS OF SAMPLES POTENTIALLY SUBJECT TO EROSION
- 专利标题(中): 表征可能潜在腐蚀的样品金属部分的PICOSECOND超声波
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申请号: US12449837申请日: 2008-02-28
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公开(公告)号: US20100281981A1公开(公告)日: 2010-11-11
- 发明人: Guray Tas , Sean P. Leary , Dario Alliata , Jana Clerico , Priya Mukundhan , Zhongning Dai
- 申请人: Guray Tas , Sean P. Leary , Dario Alliata , Jana Clerico , Priya Mukundhan , Zhongning Dai
- 国际申请: PCT/US08/02649 WO 20080228
- 主分类号: G01H17/00
- IPC分类号: G01H17/00
摘要:
A method for evaluating a manufacturing process is described. The method includes generating an optical pump beam pulse and directing the optical pump beam pulse to a surface of a sample. A probe pulse is generated and directed the probe pulse to the surface of the sample. A probe pulse response signal is detected. A change in the probe pulse varying in response to the acoustic signal forms the probe pulse response signal. An evaluation of one or more manufacturing process steps used to create the sample is made based upon the probe pulse response signal. Additionally the method may be used for process control of a CMP process. Apparatus are also described.
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