发明申请
US20100317185A1 SUBSTRATE TREATING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME 有权
基板处理方法及使用其制造半导体器件的方法

  • 专利标题: SUBSTRATE TREATING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
  • 专利标题(中): 基板处理方法及使用其制造半导体器件的方法
  • 申请号: US12813823
    申请日: 2010-06-11
  • 公开(公告)号: US20100317185A1
    公开(公告)日: 2010-12-16
  • 发明人: Rita VosPaul MertensTom SchramMasayuki Wada
  • 申请人: Rita VosPaul MertensTom SchramMasayuki Wada
  • 优先权: JP2009-140740 20090612
  • 主分类号: H01L21/28
  • IPC分类号: H01L21/28
SUBSTRATE TREATING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
摘要:
A substrate treating method comprising a step of preparing a semiconductor substrate (W, 11) which has an oxide film (13, 14) containing at least one of a rare earth oxide and an alkaline earth oxide, at least a portion of the oxide film (13, 14) being exposed, and a rinse step of supplying the oxide film (13, 14) on the semiconductor substrate (W, 11) with a rinse liquid made of an alkaline chemical or an organic solvent. Preferably, the alkaline chemical is an alkaline aqueous solution having a pH of more than 7. Further, preferably, the organic solvent is a high concentration organic solvent having a concentration of substantially 100%.
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