发明申请
US20110000780A1 TOP PLATE OF MICROWAVE PLASMA PROCESSING APPARATUS, PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
有权
微波等离子体处理装置顶板,等离子体处理装置和等离子体处理方法
- 专利标题: TOP PLATE OF MICROWAVE PLASMA PROCESSING APPARATUS, PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
- 专利标题(中): 微波等离子体处理装置顶板,等离子体处理装置和等离子体处理方法
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申请号: US12867343申请日: 2009-02-10
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公开(公告)号: US20110000780A1公开(公告)日: 2011-01-06
- 发明人: Caizhong Tian , Kiyotaka Ishibashi , Toshihisa Nozawa
- 申请人: Caizhong Tian , Kiyotaka Ishibashi , Toshihisa Nozawa
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 优先权: JP2008-031310 20080213
- 国际申请: PCT/JP2009/052200 WO 20090210
- 主分类号: H05H1/46
- IPC分类号: H05H1/46
摘要:
A plasma generation chamber of a plasma processing apparatus is closed by a top plate 3. The top plate 3 has recesses 3A on its surface facing the plasma generation chamber and a central recess 3B on an opposite surface. The top plate 3 is coupled to an antenna thereon. If a microwave is supplied to the antenna, the microwave is radiated through slots of the antenna. The microwave is propagated through the top plate 3 such that the microwave has a plane of polarization and the microwave forms a circularly polarized wave as a whole. Here, resonance absorption of the microwave occurs at a side surface of recesses 3A and the microwave is propagated within the recesses 3A in a single mode. Strong plasma can be generated within each of the recesses 3A, so that a stable plasma mode can be generated in the top plate 3.
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