Invention Application
US20110012617A1 METHODS AND SYSTEMS FOR TESTING DIGITAL-TO-ANALOG CONVERTER/AMPLIFIER CIRCUITS
有权
用于测试数字到模拟转换器/放大器电路的方法和系统
- Patent Title: METHODS AND SYSTEMS FOR TESTING DIGITAL-TO-ANALOG CONVERTER/AMPLIFIER CIRCUITS
- Patent Title (中): 用于测试数字到模拟转换器/放大器电路的方法和系统
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Application No.: US12504428Application Date: 2009-07-16
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Publication No.: US20110012617A1Publication Date: 2011-01-20
- Inventor: Yoshikuni GOSHIMA , Seiichi Tsuchiya , Yoshimasa Sanmiya , John William Kay , Chising Lai
- Applicant: Yoshikuni GOSHIMA , Seiichi Tsuchiya , Yoshimasa Sanmiya , John William Kay , Chising Lai
- Main IPC: H01H31/02
- IPC: H01H31/02

Abstract:
A digital-to-analog converter (DAC)/amplifier testing system for use in an electron-beam (e-beam) mask writer, the e-beam mask writer including a plurality of DAC/amplifier circuits to output analog voltage signals, each DAC/amplifier circuit having a first output terminal and a second output terminal, the first output terminals of the plurality of DAC/amplifier circuits being respectively coupled to deflection plates of the e-beam mask writer to provide the output analog voltages as deflection voltages, is provided. The testing system including a summation circuit to sum voltage signals and to output a summation signal indicating the sum of the received analog voltage signals and an analyzer circuit to digitize the summation signal and to detect to compare the digitized summation signal with an error tolerance range to detect whether at least one of the DAC/amplifier circuits is experiencing an operating error.
Public/Granted literature
- US07898447B2 Methods and systems for testing digital-to-analog converter/amplifier circuits Public/Granted day:2011-03-01
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