发明申请
- 专利标题: EDDY CURRENT INSPECTION SYSTEM AND METHOD
- 专利标题(中): EDDY电流检测系统和方法
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申请号: US12563403申请日: 2009-09-21
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公开(公告)号: US20110068784A1公开(公告)日: 2011-03-24
- 发明人: Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
- 申请人: Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
- 申请人地址: US NY SCHENECTADY
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: US NY SCHENECTADY
- 主分类号: G01R33/06
- IPC分类号: G01R33/06 ; G01R1/06 ; G01R33/00
摘要:
A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
公开/授权文献
- US08436608B2 Eddy current inspection system and method 公开/授权日:2013-05-07
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