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    Omnidirectional eddy current probes, array probes, and inspection systems
    1.
    发明授权
    Omnidirectional eddy current probes, array probes, and inspection systems 失效
    全向涡流探头，阵列探头和检测系统

    公开(公告)号：US06888347B2

    公开(公告)日：2005-05-03

    申请号：US10662681

    申请日：2003-09-12

    申请人： Thomas James Batzinger ,  Shridhar Champaknath Nath ,  Curtis Wayne Rose

    发明人： Thomas James Batzinger ,  Shridhar Champaknath Nath ,  Curtis Wayne Rose

    IPC分类号： G01N27/90 ,  G01N27/82

    CPC分类号： G01N27/9033

    摘要： An omnidirectional eddy current probe includes a number of sense coils arranged in a stack having a principal axis. At least two of the sense coils are rotationally skewed about the principal axis relative to one another. The sense coils are operatively connected to each other and a drive coil is also positioned in the stack. An impulse through the drive coil induces a magnetic influx through a conducting material specimen having a surface, thereby generating eddy currents on the surface. Secondary magnetic field generated from the eddy currents produces corresponding signals in the sense coils, and the signals are then analyzed for the possibility of surface flaw in the conducting material.

    摘要翻译： 全向涡流探针包括布置在具有主轴的堆叠中的多个感测线圈。 感测线圈中的至少两个相对于彼此围绕主轴旋转倾斜。 感测线圈可操作地彼此连接，并且驱动线圈也位于堆叠中。 通过驱动线圈的冲击通过具有表面的导电材料试样引起磁流入，从而在表面上产生涡流。 从涡流产生的二次磁场在感测线圈中产生相应的信号，然后分析信号中导电材料表面缺陷的可能性。

    Method for in-situ eddy current inspection of coated components in turbine engines
    4.
    发明授权
    Method for in-situ eddy current inspection of coated components in turbine engines 失效
    涡轮发动机涂层部件原位涡流检测方法

    公开(公告)号：US06707297B2

    公开(公告)日：2004-03-16

    申请号：US10122836

    申请日：2002-04-15

    申请人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Yuri Alexeyevich Plotnikov ,  Kenneth Gordon Herd

    发明人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Yuri Alexeyevich Plotnikov ,  Kenneth Gordon Herd

    IPC分类号： G01N2782

    CPC分类号： G01N27/9046

    摘要： A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.

    摘要翻译： 用于至少一个涂覆部件的原位涡流检查的方法包括在涂覆部件的外表面上的测量位置处施加驱动脉冲，同时将涂覆部件安装在涂覆部件的操作环境中。 涂覆的部件包括贱金属和设置在母材上的涂层。 该方法还包括从涂覆部件接收响应信号，将响应信号与参考信号进行比较以获得比较信号，分析用于裂纹检测的比较信号，以及确定测量位置附近的裂纹是否穿透到基底金属 如果指示涂层中存在裂纹。

    Self reference eddy current probe, measurement system, and measurement method
    6.
    发明授权
    Self reference eddy current probe, measurement system, and measurement method 有权
    自参考涡流探头，测量系统和测量方法

    公开(公告)号：US06670808B2

    公开(公告)日：2003-12-30

    申请号：US09682376

    申请日：2001-08-27

    申请人： Shridhar Champaknath Nath ,  Curtis Wayne Rose ,  Carl Stephen Lester ,  Thomas James Batzinger

    发明人： Shridhar Champaknath Nath ,  Curtis Wayne Rose ,  Carl Stephen Lester ,  Thomas James Batzinger

    IPC分类号： G01B706

    CPC分类号： G01B7/105 ,  G01N27/904

    摘要： A self referencing eddy current probe for determining conductive coating thickness includes a housing having a reference sample area, for accommodating a reference sample, and a testing edge, for positioning on a component during a coating thickness measurement. The eddy current probe further includes a reference eddy current coil situated in the housing adjacent to the reference sample area and a test eddy current coil, which is located at the testing edge. A self referencing eddy current measurement system, for measuring a thickness of a conductive coating on a component, includes the self referencing eddy current probe. The system further includes a signal generator for energizing the test and reference coils and a comparison module for comparing a test signal received from the test coil and a reference signal received from the reference coil and outputting a compared signal.

    摘要翻译： 用于确定导电涂层厚度的自参考涡流探针包括具有用于容纳参考样品的参考样品区域的壳体和用于在涂层厚度测量期间在组件上定位的测试边缘。 涡流探头还包括位于壳体中的参考涡流线圈，其与参考样品区域相邻，并且测试涡流线圈位于测试边缘。 用于测量部件上的导电涂层的厚度的自参考涡流测量系统包括自参考涡流探针。 该系统还包括用于激励测试和参考线圈的信号发生器和用于比较从测试线圈接收的测试信号和从参考线圈接收的参考信号并输出​​比较信号的比较模块。

    Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component
    7.
    发明授权
    Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component 失效
    用于检测导电部件中的缺陷的涡流检查方法和装置

    公开(公告)号：US06414483B1

    公开(公告)日：2002-07-02

    申请号：US09627049

    申请日：2000-07-27

    申请人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Paul Peter Stryjek

    发明人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Paul Peter Stryjek

    IPC分类号： G01N2782

    CPC分类号： G01N27/9006

    摘要： A method of inspecting a preselected area of an electrically conductive component to determine whether flaws are present. The method includes the steps of permanently mounting an eddy current element on the component over the preselected area and energizing the element to generate alternating magnetic fields proximate the component. An electrical signal generated by a secondary magnetic field formed proximate the component is detected using the element and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw in the component. Inspection apparatus for performing this method is also disclosed.

    摘要翻译： 检查导电部件的预选区域以确定是否存在缺陷的方法。 该方法包括以下步骤：将涡流元件永久性地安装在预选区域上的部件上，并激励该元件以产生接近该部件的交变磁场。 使用元件检测由邻近分量形成的次级磁场产生的电信号，并将检测到的电信号与参考信号进行比较，以确定检测信号是否不同于参考信号。 差异表明组件中存在缺陷。 还公开了用于执行该方法的检查装置。

    Omnidirectional eddy current probe and inspection system
    9.
    发明授权
    Omnidirectional eddy current probe and inspection system 失效
    全向涡流探头和检测系统

    公开(公告)号：US07015690B2

    公开(公告)日：2006-03-21

    申请号：US10856381

    申请日：2004-05-27

    申请人： Changting Wang ,  Yuri Alexeyevich Plotnikov ,  Shridhar Champaknath Nath ,  William Stewart McKnight ,  Gigi Olive Gambrell

    发明人： Changting Wang ,  Yuri Alexeyevich Plotnikov ,  Shridhar Champaknath Nath ,  William Stewart McKnight ,  Gigi Olive Gambrell

    IPC分类号： G01N27/90 ,  G01N27/72

    CPC分类号： G01N27/902 ,  G01N27/9033 ,  G01N27/904

    摘要： An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.

    摘要翻译： 全向涡流（EC）探针包括至少一个具有第一和第二感测线圈的EC通道，该第一和第二感测线圈在第一（x）和第二（y）方向上偏移并且在至少一个方向（x， y）。 至少一个驱动线圈被配置为在感测线圈附近产生用于EC通道的探测场。 全方位的EC检测系统包括一个包括多个EC通道和驱动线圈的全向EC阵列探针（ECAP）。 每个EC通道包括具有相反极性的第一和第二感测线圈。 驱动线圈具有交替极性。 电气连接对相应的EC通道执行差分感测。 纠正驱动线圈设置在EC通道的相应末端并产生探测场。 涡流仪器连接到全向ECAP，并从EC通道接收差分感测信号。

    Magnetic device for a magnetic trip unit
    10.
    发明授权
    Magnetic device for a magnetic trip unit 有权
    用于磁力跳闸单元的磁性装置

    公开(公告)号：US06794963B2

    公开(公告)日：2004-09-21

    申请号：US10063457

    申请日：2002-04-24

    申请人： Thomas Gary O'Keeffe ,  Christian Daehler ,  Shridhar Champaknath Nath ,  Anitha Bochala

    发明人： Thomas Gary O'Keeffe ,  Christian Daehler ,  Shridhar Champaknath Nath ,  Anitha Bochala

    IPC分类号： H01H900

    CPC分类号： H01H71/7463 ,  H01H1/2041 ,  H01H71/2463

    摘要： A magnetic trip unit for actuating a latching mechanism to trip a circuit breaker upon an overcurrent condition, the magnetic trip unit includes: a flux return component in electromagnetic communication with an electrically conductive strap; a tube disposed within the flux return component; a stator disposed at a first end of the tube and connected to the flux return component, the stator having a stator surface at one end; and a plunger slidably extending from a second end of the tube, the plunger comprises a plunger surface at one end facing the stator surface, the plunger further includes another end adapted to operably interact with the latching mechanism, the plunger is biased to a predetermined gap position.

    摘要翻译： 一种用于致动闭锁机构以在过电流状态下使断路器跳闸的磁脱扣单元，所述磁脱扣单元包括：与导电带电磁连通的磁通返回部件; 设置在所述通量返回部件内的管; 定子，其设置在所述管的第一端并连接到所述磁通返回部件，所述定子在一端具有定子表面; 以及柱塞，其从所述管的第二端部可滑动地延伸，所述柱塞包括在面向所述定子表面的一端处的柱塞表面，所述柱塞还包括适于与所述闭锁机构可操作地相互作用的另一端，所述柱塞被偏压到预定间隙 位置。