发明申请
- 专利标题: SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING
- 专利标题(中): SEGMENTED BITSCAN用于验证编程
-
申请号: US13035539申请日: 2011-02-25
-
公开(公告)号: US20110141819A1公开(公告)日: 2011-06-16
- 发明人: Yan Li , Teruhiko Kamei , Jeffrey W. Lutze
- 申请人: Yan Li , Teruhiko Kamei , Jeffrey W. Lutze
- 主分类号: G11C16/10
- IPC分类号: G11C16/10
摘要:
A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.
公开/授权文献
- US08400836B2 Segmented bitscan for verification of programming 公开/授权日:2013-03-19
信息查询