SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING
    1.
    发明申请
    SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING 有权
    SEGMENTED BITSCAN用于验证编程

    公开(公告)号:US20110141819A1

    公开(公告)日:2011-06-16

    申请号:US13035539

    申请日:2011-02-25

    IPC分类号: G11C16/10

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    APPARATUS WITH SEGEMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING
    2.
    发明申请
    APPARATUS WITH SEGEMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING 有权
    用于验证编程的配置BITSCAN的设备

    公开(公告)号:US20080127104A1

    公开(公告)日:2008-05-29

    申请号:US11563590

    申请日:2006-11-27

    IPC分类号: G06F9/44

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    Segmented bitscan for verification of programming
    3.
    发明授权
    Segmented bitscan for verification of programming 有权
    分段位扫描用于验证编程

    公开(公告)号:US07724580B2

    公开(公告)日:2010-05-25

    申请号:US12431573

    申请日:2009-04-28

    IPC分类号: G11C16/04

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    Segmented bitscan for verification of programming
    4.
    发明授权
    Segmented bitscan for verification of programming 有权
    分段位扫描用于验证编程

    公开(公告)号:US07545681B2

    公开(公告)日:2009-06-09

    申请号:US11563585

    申请日:2006-11-27

    IPC分类号: G11C16/04

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    SEGEMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING
    5.
    发明申请
    SEGEMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING 有权
    SEGEMENTED BITSCAN用于验证编程

    公开(公告)号:US20080126676A1

    公开(公告)日:2008-05-29

    申请号:US11563585

    申请日:2006-11-27

    IPC分类号: G06F12/02

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING
    6.
    发明申请
    SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING 有权
    SEGMENTED BITSCAN用于验证编程

    公开(公告)号:US20100195405A1

    公开(公告)日:2010-08-05

    申请号:US12755610

    申请日:2010-04-07

    IPC分类号: G11C16/06

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING
    7.
    发明申请
    SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING 有权
    SEGMENTED BITSCAN用于验证编程

    公开(公告)号:US20090207661A1

    公开(公告)日:2009-08-20

    申请号:US12431573

    申请日:2009-04-28

    IPC分类号: G11C16/02 G11C16/06 G11C16/04

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    Apparatus with segmented bitscan for verification of programming
    8.
    发明授权
    Apparatus with segmented bitscan for verification of programming 有权
    具有分段位扫描的装置,用于验证编程

    公开(公告)号:US07440319B2

    公开(公告)日:2008-10-21

    申请号:US11563590

    申请日:2006-11-27

    IPC分类号: G11C16/06

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。

    Segmented bitscan for verification of programming

    公开(公告)号:US08400836B2

    公开(公告)日:2013-03-19

    申请号:US13035539

    申请日:2011-02-25

    IPC分类号: G11C16/04

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    Segmented bitscan for verification of programming
    10.
    发明授权
    Segmented bitscan for verification of programming 有权
    分段位扫描用于验证编程

    公开(公告)号:US07924625B2

    公开(公告)日:2011-04-12

    申请号:US12755610

    申请日:2010-04-07

    IPC分类号: G11C16/04

    摘要: A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.

    摘要翻译: 一组非易失性存储元件经受编程处理以便存储一组数据。 在编程过程中,执行一个或多个验证操作以确定非易失性存储元件是否已经达到其目标条件以存储适当的数据。 关于是继续编程还是编程成功的决定是基于非易失性存储元件的重叠组是否具有小于非正确编程的非易失性存储元件的阈值数量来进行。