发明申请
- 专利标题: X-RAY DETECTOR
- 专利标题(中): X射线探测器
-
申请号: US12972393申请日: 2010-12-17
-
公开(公告)号: US20110147741A1公开(公告)日: 2011-06-23
- 发明人: Kwan-Wook Jung , Dong-Hyuk Kim
- 申请人: Kwan-Wook Jung , Dong-Hyuk Kim
- 申请人地址: KR Yongin-City
- 专利权人: SAMSUNG MOBILE DISPLAY CO., LTD.
- 当前专利权人: SAMSUNG MOBILE DISPLAY CO., LTD.
- 当前专利权人地址: KR Yongin-City
- 优先权: KR10-2009-0127307 20091218
- 主分类号: H01L31/119
- IPC分类号: H01L31/119
摘要:
An X-ray detector constructed as an exemplary embodiment of the present invention includes a semiconductor layer, a data line including a source electrode covering a first portion of the semiconductor layer, a drain electrode disposed opposite to the source electrode, a first lower electrode formed on the upper portion of a second portion of the semiconductor layer and a gate insulating layer and elongated from the drain electrode, and a passivation layer formed on the upper portion of one part of the lower electrode including the drain electrode. Further, the second lower electrode is formed approaching the gate electrode. The X-ray detector constructed as the exemplary embodiment of the present invention includes a second lower electrode formed on the passivation layer and placed approaching a gate electrode. The area in which a diode is disposed may be maximized, and the amount of leakage current may be reduced.
公开/授权文献
- US08299465B2 X-ray detector 公开/授权日:2012-10-30
信息查询
IPC分类: