发明申请
- 专利标题: IMPRINT LITHOGRAPHIC APPARATUS AND IMPRINT LITHOGRAPHIC METHOD
- 专利标题(中): 印刷光刻设备和印刷光刻方法
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申请号: US12964459申请日: 2010-12-09
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公开(公告)号: US20110163477A1公开(公告)日: 2011-07-07
- 发明人: Hans Butler , Johannes Petrus Martinus Bernardus Vermeulen , Marc Wilhelmus Maria Van Der Wijst , Jeroen Pieter Starreveld , Cornelius Adrianus Lambertus De Hoon , Francois Xavier Debiesme
- 申请人: Hans Butler , Johannes Petrus Martinus Bernardus Vermeulen , Marc Wilhelmus Maria Van Der Wijst , Jeroen Pieter Starreveld , Cornelius Adrianus Lambertus De Hoon , Francois Xavier Debiesme
- 申请人地址: NL Veldhoven
- 专利权人: ASML NETHERLANDS B.V.
- 当前专利权人: ASML NETHERLANDS B.V.
- 当前专利权人地址: NL Veldhoven
- 主分类号: B29C59/02
- IPC分类号: B29C59/02
摘要:
An imprint lithography apparatus includes an actuator configured to displace an imprint template holder relative to a substrate holder to perform an imprint process. The imprint template holder and/or the substrate holder being supported on a support structure, the support structure being mounted to a vibration isolation system that is mounted to a base of the apparatus. The vibration isolation system is configured to provide a vibration isolation of the support structure relative to the base. A control unit is configured to control the actuator during the imprint process. The control unit is arranged to control an adjustable member of the vibration isolation system to adjust a dynamical characteristic of the vibration isolation system during at least part of the imprint process so as to reduce a displacement of the support structure relative to the base due to a force exerted on the support structure during the imprint process.
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