Invention Application
- Patent Title: FAULT-TOLERANT MULTI-CHIP MODULE
- Patent Title (中): 容错多芯片模块
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Application No.: US12685159Application Date: 2010-01-11
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Publication No.: US20110169522A1Publication Date: 2011-07-14
- Inventor: Kannan Raj , Xuezhe Zheng , Ashok V. Krishnamoorthy , Ronald Ho , Michael O. McCracken , David K. McElfresh , John E. Cunningham
- Applicant: Kannan Raj , Xuezhe Zheng , Ashok V. Krishnamoorthy , Ronald Ho , Michael O. McCracken , David K. McElfresh , John E. Cunningham
- Applicant Address: US CA Santa Clara
- Assignee: SUN MICROSYSTEMS, INC.
- Current Assignee: SUN MICROSYSTEMS, INC.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H03K19/003
- IPC: H03K19/003

Abstract:
A multi-chip module (MCM) is described. This MCM includes multiple sites, where a given site in the multiple sites includes multiple chips with proximity connectors that communicate information through proximity communication within the MCM via multiple components associated with the given site. Note that the MCM includes global redundancy and local redundancy at the given site. In particular, the global redundancy involves providing one or more redundant sites in the multiple sites. Furthermore, the local redundancy involves providing one or more redundant chips in the multiple chips and one or more redundant components in the multiple components.
Public/Granted literature
- US08207752B2 Fault-tolerant multi-chip module Public/Granted day:2012-06-26
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