发明申请
- 专利标题: FAULT-TOLERANT MULTI-CHIP MODULE
- 专利标题(中): 容错多芯片模块
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申请号: US12685159申请日: 2010-01-11
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公开(公告)号: US20110169522A1公开(公告)日: 2011-07-14
- 发明人: Kannan Raj , Xuezhe Zheng , Ashok V. Krishnamoorthy , Ronald Ho , Michael O. McCracken , David K. McElfresh , John E. Cunningham
- 申请人: Kannan Raj , Xuezhe Zheng , Ashok V. Krishnamoorthy , Ronald Ho , Michael O. McCracken , David K. McElfresh , John E. Cunningham
- 申请人地址: US CA Santa Clara
- 专利权人: SUN MICROSYSTEMS, INC.
- 当前专利权人: SUN MICROSYSTEMS, INC.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: H03K19/003
- IPC分类号: H03K19/003
摘要:
A multi-chip module (MCM) is described. This MCM includes multiple sites, where a given site in the multiple sites includes multiple chips with proximity connectors that communicate information through proximity communication within the MCM via multiple components associated with the given site. Note that the MCM includes global redundancy and local redundancy at the given site. In particular, the global redundancy involves providing one or more redundant sites in the multiple sites. Furthermore, the local redundancy involves providing one or more redundant chips in the multiple chips and one or more redundant components in the multiple components.
公开/授权文献
- US08207752B2 Fault-tolerant multi-chip module 公开/授权日:2012-06-26
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