发明申请
- 专利标题： RELIABILITY AND PERFORMANCE OF A SYSTEM-ON-A-CHIP BY PREDICTIVE WEAR-OUT BASED ACTIVATION OF FUNCTIONAL COMPONENTS
- 专利标题（中）： 通过预测性消除功能组件激活的系统对芯片的可靠性和性能
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申请号： US12727967申请日： 2010-03-19
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公开(公告)号： US20110173432A1公开(公告)日： 2011-07-14
- 发明人: Chen-Yong Cher , Paul W. Coteus , Alan Gara , Eren Kursun , David P. Paulsen , Brian A. Schuelke , John E. Sheets, II , Shurong Tian
- 申请人： Chen-Yong Cher , Paul W. Coteus , Alan Gara , Eren Kursun , David P. Paulsen , Brian A. Schuelke , John E. Sheets, II , Shurong Tian
- 申请人地址： US NY Armonk
- 专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址： US NY Armonk
- 主分类号： G06F1/24
- IPC分类号： G06F1/24 ; G06F15/00
摘要：
A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
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