发明申请
- 专利标题: APPARATUS FOR CONTROLLING TEMPERATURE UNIFORMITY OF A SUBSTRATE
- 专利标题(中): 用于控制基板温度均匀性的装置
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申请号: US12886255申请日: 2010-09-20
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公开(公告)号: US20110180243A1公开(公告)日: 2011-07-28
- 发明人: KALLOL BERA , XIAOPING ZHOU , DOUGLAS A. BUCHBERGER, JR. , ANDREW NGUYEN , HAMID TAVASSOLI , SURAJIT KUMAR , SHAHID RAUF
- 申请人: KALLOL BERA , XIAOPING ZHOU , DOUGLAS A. BUCHBERGER, JR. , ANDREW NGUYEN , HAMID TAVASSOLI , SURAJIT KUMAR , SHAHID RAUF
- 申请人地址: US CA Santa Clara
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: F28F3/12
- IPC分类号: F28F3/12
摘要:
Apparatus for controlling thermal uniformity of a substrate is provided herein. In some embodiments, the thermal uniformity of the substrate may be controlled to be more uniform. In some embodiments, the thermal uniformity of the substrate may be controlled to be non-uniform in a desired pattern. In some embodiments, an apparatus for controlling thermal uniformity of a substrate may include a substrate support having a support surface to support a substrate thereon; and a plurality of flow paths having a substantially equivalent fluid conductance disposed within the substrate support to flow a heat transfer fluid beneath the support surface.
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