发明申请
- 专利标题: SYNCHRONOUS MULTI-TEMPERATURE SENSOR FOR SEMICONDUCTOR INTEGRATED CIRCUITS
- 专利标题(中): 用于半导体集成电路的同步多温度传感器
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申请号: US12946928申请日: 2010-11-16
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公开(公告)号: US20110208471A1公开(公告)日: 2011-08-25
- 发明人: Seong Seop Lee , Saeng Hwan Kim
- 申请人: Seong Seop Lee , Saeng Hwan Kim
- 申请人地址: KR Icheon-si
- 专利权人: HYNIX SEMICONDUCTOR INC.
- 当前专利权人: HYNIX SEMICONDUCTOR INC.
- 当前专利权人地址: KR Icheon-si
- 优先权: KR10-2010-0017336 20100225
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; G01K13/00
摘要:
A temperature sensor includes a counting signal generation unit, a counting signal decoding unit, an input reference voltage selection unit, and a latch pulse generation unit. The counting signal generation unit is configured to generate one or more counting signals in response to an oscillation signal. The counting signal decoding unit is configured to decode the one or more counting signals and to generate one or more test selection signals and an end signal. The input reference voltage selection unit is configured to output a first selection reference voltage or a second selection reference voltage as an input reference voltage in response to the one or more test selection signals. The latch pulse generation unit is configured to generate one or more latch pulses in response to the one or more test selection signals.
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