Invention Application
- Patent Title: DETECTION OF PARTICLE CHARACTERISTICS
- Patent Title (中): 颗粒特性的检测
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Application No.: US13062301Application Date: 2009-09-04
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Publication No.: US20110255087A1Publication Date: 2011-10-20
- Inventor: Brian Alexander , Nitin Vayeda , Kemal Ajay
- Applicant: Brian Alexander , Nitin Vayeda , Kemal Ajay
- Applicant Address: BS Nassau, NP
- Assignee: Xtrails Technologies Ltd.
- Current Assignee: Xtrails Technologies Ltd.
- Current Assignee Address: BS Nassau, NP
- Priority: AU2008904626 20080905
- International Application: PCT/AU2009/001162 WO 20090904
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method of detecting particles in an air flow is described. The method includes receiving a signal indicative of light intensity scattered from the air flow at a plurality of wavelengths and processing the signal indicative of the intensity of received light at each of the wavelengths and a corresponding wavelength dependent parameter to generate an output signal indicative of at least one characteristic of particles in the air flow. A particle detection system is also described.
Public/Granted literature
- US09128047B2 Detection of particle characteristics Public/Granted day:2015-09-08
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