发明申请
- 专利标题: Testing device and testing method
- 专利标题(中): 检测装置及检测方法
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申请号: US13067421申请日: 2011-06-01
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公开(公告)号: US20110309850A1公开(公告)日: 2011-12-22
- 发明人: Atsushi Yoshida , Hiroyuki Toya , Toru Nishizawa , Seizo Uchiyama
- 申请人: Atsushi Yoshida , Hiroyuki Toya , Toru Nishizawa , Seizo Uchiyama
- 申请人地址: JP Kawasaki-shi
- 专利权人: Fuji Electric Co., Ltd.
- 当前专利权人: Fuji Electric Co., Ltd.
- 当前专利权人地址: JP Kawasaki-shi
- 优先权: JP2010-126680 20100602
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
A testing device includes a pressure vessel, a mounting stand disposed in an internal space of the pressure vessel, on which a device to be tested is mounted, test electrodes, disposed in the internal space of the pressure vessel, that supply a test voltage to the device to be tested mounted on the mounting stand, and a pressurization unit that raises the pressure of the internal space of the pressure vessel. The test voltage is supplied from the test electrodes to the device to be tested mounted on the mounting stand, and testing of the device to be tested is carried out, in a condition that the pressure of the internal space of the pressure vessel is raised by the pressurization unit.
公开/授权文献
- US08610446B2 Testing device and testing method 公开/授权日:2013-12-17
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