Invention Application
- Patent Title: Self-Assembly Pattern for Semiconductor Integrated Circuit
- Patent Title (中): 半导体集成电路的自组装模式
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Application No.: US13268191Application Date: 2011-10-07
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Publication No.: US20120028477A1Publication Date: 2012-02-02
- Inventor: Tsung-Lin Lee , Clement Hsingjen Wann , Ching-Yu Chang
- Applicant: Tsung-Lin Lee , Clement Hsingjen Wann , Ching-Yu Chang
- Applicant Address: TW Hsin-Chu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsin-Chu
- Main IPC: H01L21/312
- IPC: H01L21/312

Abstract:
A method of fabricating a semiconductor device is provided which includes providing a substrate. A material layer is formed over the substrate. A polymer layer is formed over the material layer. A nano-sized feature is self-assembled using a portion of the polymer layer. The substrate is patterned using the nano-sized feature.
Public/Granted literature
- US08497201B2 Self-assembly pattern for semiconductor integrated circuit Public/Granted day:2013-07-30
Information query
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