Invention Application
US20120044006A1 DC OFFSET CALIBRATION APPARATUS, DC OFFSET CALIBRATION SYSTEM, AND METHOD THEREOF
审中-公开
DC偏移校准装置,DC偏移校准系统及其方法
- Patent Title: DC OFFSET CALIBRATION APPARATUS, DC OFFSET CALIBRATION SYSTEM, AND METHOD THEREOF
- Patent Title (中): DC偏移校准装置,DC偏移校准系统及其方法
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Application No.: US12886550Application Date: 2010-09-20
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Publication No.: US20120044006A1Publication Date: 2012-02-23
- Inventor: Shiau-Wen Kao , Jia-Hung Peng , Ming-Ching Kuo
- Applicant: Shiau-Wen Kao , Jia-Hung Peng , Ming-Ching Kuo
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Priority: TW99127786 20100819
- Main IPC: H03L5/00
- IPC: H03L5/00

Abstract:
A DC offset calibration apparatus including a signal processing unit, a comparison unit, a first resistor array, a second resistor array, and a resistor array control unit is provided. The signal processing unit receives an input differential signal and generates an output differential signal. The comparison unit detects and determines a first DC output voltage and a second DC output voltage of the output differential signal and generates a DC offset signal. First ends of the first resistor array and the second resistor array are respectively coupled to a first input terminal and a second input terminal of the signal processing unit. The resistor array control unit adjusts resistances of the first and the second resistor array according to the DC offset signal and a bit code sequence until the DC offset signal enters a transient state, so as to calibrate a DC offset voltage in the output differential signal.
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