发明申请
US20120044006A1 DC OFFSET CALIBRATION APPARATUS, DC OFFSET CALIBRATION SYSTEM, AND METHOD THEREOF
审中-公开
DC偏移校准装置,DC偏移校准系统及其方法
- 专利标题: DC OFFSET CALIBRATION APPARATUS, DC OFFSET CALIBRATION SYSTEM, AND METHOD THEREOF
- 专利标题(中): DC偏移校准装置,DC偏移校准系统及其方法
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申请号: US12886550申请日: 2010-09-20
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公开(公告)号: US20120044006A1公开(公告)日: 2012-02-23
- 发明人: Shiau-Wen Kao , Jia-Hung Peng , Ming-Ching Kuo
- 申请人: Shiau-Wen Kao , Jia-Hung Peng , Ming-Ching Kuo
- 申请人地址: TW Hsinchu
- 专利权人: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- 当前专利权人: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- 当前专利权人地址: TW Hsinchu
- 优先权: TW99127786 20100819
- 主分类号: H03L5/00
- IPC分类号: H03L5/00
摘要:
A DC offset calibration apparatus including a signal processing unit, a comparison unit, a first resistor array, a second resistor array, and a resistor array control unit is provided. The signal processing unit receives an input differential signal and generates an output differential signal. The comparison unit detects and determines a first DC output voltage and a second DC output voltage of the output differential signal and generates a DC offset signal. First ends of the first resistor array and the second resistor array are respectively coupled to a first input terminal and a second input terminal of the signal processing unit. The resistor array control unit adjusts resistances of the first and the second resistor array according to the DC offset signal and a bit code sequence until the DC offset signal enters a transient state, so as to calibrate a DC offset voltage in the output differential signal.
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