发明申请
US20120049281A1 SEMICONDUCTOR DEVICE WITH EFFECTIVE WORK FUNCTION CONTROLLED METAL GATE
审中-公开
具有有效工作功能的半导体器件控制金属栅
- 专利标题: SEMICONDUCTOR DEVICE WITH EFFECTIVE WORK FUNCTION CONTROLLED METAL GATE
- 专利标题(中): 具有有效工作功能的半导体器件控制金属栅
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申请号: US12870011申请日: 2010-08-27
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公开(公告)号: US20120049281A1公开(公告)日: 2012-03-01
- 发明人: Yoshinori Tsuchiya , Ryosuke Iijima , Atsushi Yagishita
- 申请人: Yoshinori Tsuchiya , Ryosuke Iijima , Atsushi Yagishita
- 申请人地址: US CA Irvine
- 专利权人: TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
- 当前专利权人: TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
- 当前专利权人地址: US CA Irvine
- 主分类号: H01L27/12
- IPC分类号: H01L27/12 ; H01L21/762
摘要:
According to one embodiment, gate electrodes of a multi-gate field effect transistors and methods of making a gate electrode of a multi-gate field effect transistor are provided. The gate electrode can contain a semiconductor substrate; a dielectric layer over the semiconductor substrate; a fin over the dielectric layer; a gate insulating layer over the side surfaces of the fin; a gate electrode layer over the fin; and a polysilicon layer over the fin. The gate electrode does not contain a gate insulating layer over the upper surface of the dielectric layer except portions of the upper surface of the dielectric layer that contact with the side surfaces of the gate insulating layer formed over the side surface of the fin. In another embodiment, the gate electrode can contain an oxygen diffusion barrier layer or a first oxygen diffusion layer over the upper surface of the dielectric layer.
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