发明申请
- 专利标题: SOI SUBSTRATE AND METHOD FOR MANUFACTURING SOI SUBSTRATE
- 专利标题(中): SOI衬底和制造SOI衬底的方法
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申请号: US13339427申请日: 2011-12-29
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公开(公告)号: US20120098086A1公开(公告)日: 2012-04-26
- 发明人: Shunpei YAMAZAKI , Maki TOGAWA , Yasuyuki ARAI
- 申请人: Shunpei YAMAZAKI , Maki TOGAWA , Yasuyuki ARAI
- 申请人地址: JP Atsugi-shi
- 专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- 当前专利权人地址: JP Atsugi-shi
- 优先权: JP2007-079946 20070326
- 主分类号: H01L21/762
- IPC分类号: H01L21/762 ; H01L29/12
摘要:
An SOI substrate and a manufacturing method of the SOI substrate, by which enlargement of the substrate is possible and its productivity can be increased, are provided. A step (A) of cutting a first single crystal silicon substrate to form a second single crystal silicon substrate which has a chip size; a step (B) of forming an insulating layer on one surface of the second single crystal silicon substrate, and forming an embrittlement layer in the second single crystal substrate; and a step (C) of bonding a substrate having an insulating surface and the second single crystal silicon substrate with the insulating layer therebetween, and conducting heat treatment to separate the second single crystal silicon substrate along the embrittlement layer, and forming a single crystal silicon thin film on the substrate having an insulating surface, are conducted.
公开/授权文献
- US09111997B2 SOI substrate and method for manufacturing SOI substrate 公开/授权日:2015-08-18
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