发明申请
US20120111373A1 SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS AND STORAGE MEDIUM FOR SUBSTRATE CLEANING
审中-公开
基板清洗方法,基板清洗装置和基板清洗存储介质
- 专利标题: SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS AND STORAGE MEDIUM FOR SUBSTRATE CLEANING
- 专利标题(中): 基板清洗方法,基板清洗装置和基板清洗存储介质
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申请号: US13288255申请日: 2011-11-03
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公开(公告)号: US20120111373A1公开(公告)日: 2012-05-10
- 发明人: Hiroshi ARIMA , Yuichi YOSHIDA , Kousuke YOSHIHARA
- 申请人: Hiroshi ARIMA , Yuichi YOSHIDA , Kousuke YOSHIHARA
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 优先权: JP2010-247329 20101104; JP2011-196376 20110908
- 主分类号: B08B7/00
- IPC分类号: B08B7/00 ; B08B5/00 ; B08B3/04
摘要:
A method for cleaning a surface of a substrate having a circuit pattern formed thereon, includes: forming a liquid film on the surface by feeding a cleaning solution onto the center of the surface while rotating the substrate with the substrate kept horizontal; forming a dry region by discharging gas to the center while moving a position of feed of the cleaning solution on the surface by a distance from the center toward the periphery of the substrate with the substrate being rotated; moving the position of feed of the cleaning solution on the surface toward the periphery at a speed equal to a speed at which the dry region is expanded toward the periphery while rotating the substrate; and controlling temperature of the cleaning solution to form the liquid film such that the temperature becomes higher than process atmosphere temperature on the surface during feed of the cleaning solution.
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