发明申请
- 专利标题: HEAT TREATMENT APPARATUS
- 专利标题(中): 热处理设备
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申请号: US13390825申请日: 2010-08-11
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公开(公告)号: US20120145697A1公开(公告)日: 2012-06-14
- 发明人: Tomohito Komatsu , Takayuki Kamaishi , Ryoji Yamazaki
- 申请人: Tomohito Komatsu , Takayuki Kamaishi , Ryoji Yamazaki
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMMITED
- 当前专利权人: TOKYO ELECTRON LIMMITED
- 当前专利权人地址: JP Tokyo
- 优先权: JP2009-188930 20090818
- 国际申请: PCT/JP2010/063617 WO 20100811
- 主分类号: F27D11/00
- IPC分类号: F27D11/00
摘要:
A heat treatment apparatus is configured to include: a treatment chamber for accommodating therein a wafer; a substrate supporting unit for horizontally supporting the wafer in the treatment chamber; and a lamp unit provided above the treatment chamber. The lamp unit includes: a base member; a plurality of lamps provided on the lower surface of the base member whose front ends face downwardly; a plurality of ring-shaped reflectors concentrically provided on the lower surface of the base member to protrude downward; and a cooling head for supplying a cooling medium into the reflectors. At least some of the lamps are arranged along the reflectors, and cooling medium channels, each inner space of which is formed as a ring-shaped space, are respectively provided within the reflectors in the extending directions of the reflectors.
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