Invention Application
- Patent Title: INSPECTION METHOD FOR AN ACTIVE MATRIX SUBSTRATE
- Patent Title (中): 一种有源矩阵基板检测方法
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Application No.: US13410296Application Date: 2012-03-02
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Publication No.: US20120161775A1Publication Date: 2012-06-28
- Inventor: Wei-Kai Huang , Ying-Tsang Liu , Chen-Shun Tsai , Jeng-Shin Chen , Yu-Chieh Lin
- Applicant: Wei-Kai Huang , Ying-Tsang Liu , Chen-Shun Tsai , Jeng-Shin Chen , Yu-Chieh Lin
- Applicant Address: TW Hsinchu
- Assignee: AU OPTRONICS CORPORATION
- Current Assignee: AU OPTRONICS CORPORATION
- Current Assignee Address: TW Hsinchu
- Priority: TW95132144 20060831
- Main IPC: G01R31/44
- IPC: G01R31/44

Abstract:
An active matrix substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of independent common line patterns, and a plurality of pixels is provided. The scan lines, data lines, and common line patterns are disposed on the substrate. The pixels are arranged in array on the substrate, wherein each pixel is electrically connected to corresponding scan line and data line, and the common line patterns are distributed under each pixel. Each pixel includes a plurality of active components and a plurality of pixel electrodes. Each of the pixel electrodes is electrically connected to corresponding scan line and data line through different active components. The capacitance coupling effect between each of the pixel electrodes and common line patterns are different. Additionally, an inspection method for the active matrix substrate and a liquid crystal display having the active matrix substrate are further provided.
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