发明申请
US20120176144A1 AT-SPEED SCAN ENABLE SWITCHING CIRCUIT 审中-公开
AT速度扫描启用电路

AT-SPEED SCAN ENABLE SWITCHING CIRCUIT
摘要:
A circuit for providing a local scan enable signal includes a first transistor having a first gate coupled to a general scan enable signal, a first source and a first drain and a second transistor having a second gate coupled to a scan clock, a second source coupled to the first drain and a second drain. The circuit also includes a third transistor having a third gate coupled to the general scan enable signal, a third drain coupled to the second drain and a third source and an output stabilizer coupled to the second drain, the output stabilizer including a first inverter and a second inverter coupled together in opposite orientations.
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