Invention Application
- Patent Title: Spectral Phase Analysis For Precision Ranging
- Patent Title (中): 精密测距光谱相分析
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Application No.: US13361888Application Date: 2012-01-30
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Publication No.: US20120194823A1Publication Date: 2012-08-02
- Inventor: Eric Moore , Robert McLeod
- Applicant: Eric Moore , Robert McLeod
- Applicant Address: US CO Denver
- Assignee: The Regents of the University of Colorado, a body corporate
- Current Assignee: The Regents of the University of Colorado, a body corporate
- Current Assignee Address: US CO Denver
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01S13/86 ; G01B11/02

Abstract:
Interferometric path length measurements using frequency-domain interferometry form the basis of several measurement techniques, including optical frequency domain reflectometry (OFDR), optical coherence tomography (OCT), and frequency-modulated continuous wave (FMCW) radar and lidar. A phase-sensitive and self-referenced approach to frequency-domain interferometry yields absolute and relative path length measurements with axial precision orders of magnitude better than the transform-limited axial resolution of the system.
Public/Granted literature
- US09025160B2 Spectral phase analysis for precision ranging Public/Granted day:2015-05-05
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