发明申请
US20120206961A1 METHOD FOR OPERATING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE 有权
用于操作非易失性半导体存储器件的方法

  • 专利标题: METHOD FOR OPERATING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
  • 专利标题(中): 用于操作非易失性半导体存储器件的方法
  • 申请号: US13235999
    申请日: 2011-09-19
  • 公开(公告)号: US20120206961A1
    公开(公告)日: 2012-08-16
  • 发明人: Masaru KITO
  • 申请人: Masaru KITO
  • 申请人地址: JP TOKYO
  • 专利权人: KABUSHIKI KAISHA TOSHIBA
  • 当前专利权人: KABUSHIKI KAISHA TOSHIBA
  • 当前专利权人地址: JP TOKYO
  • 优先权: JP2011-026946 20110210
  • 主分类号: G11C16/10
  • IPC分类号: G11C16/10
METHOD FOR OPERATING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要:
According to one embodiment, a method for operating a nonvolatile semiconductor memory device, the device includes a memory unit having a memory string, and a control unit. The memory string includes a plurality of transistors and has a first group being part of the transistors, a adjusting transistor connected next to the first group, and a second group including transistors connected to a side opposite the first group with respect to the adjusting transistor. The method includes rewriting the threshold values of the transistors of the first group, and then performing control so as to set a first threshold value for adjustment to the adjusting transistor to adjust an amount corresponding to relative variations in the threshold values of the transistors of the second group, the relative variations being caused by the rewrite of the threshold values of the transistors of the first group.
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