Invention Application
- Patent Title: ATOMIC LAYER DEPOSITION USING RADICALS OF GAS MIXTURE
- Patent Title (中): 使用气体混合物的原子层沉积
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Application No.: US13369717Application Date: 2012-02-09
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Publication No.: US20120207948A1Publication Date: 2012-08-16
- Inventor: Sang In LEE
- Applicant: Sang In LEE
- Applicant Address: US CA Sunnyvale
- Assignee: SYNOS TECHNOLOGY, INC.
- Current Assignee: SYNOS TECHNOLOGY, INC.
- Current Assignee Address: US CA Sunnyvale
- Main IPC: C23C16/455
- IPC: C23C16/455 ; C23C16/50

Abstract:
Performing atomic layer deposition (ALD) using radicals of a mixture of nitrogen compounds to increase the deposition rate of a layer deposited on a substrate. A mixture of nitrogen compound gases is injected into a radical reactor. Plasma of the compound gas is generated by applying voltage across two electrodes in the radical reactor to generate radicals of the nitrogen compound gases. The radicals are injected onto the surface of a substrate previously injected with source precursor. The radicals function as a reactant precursor and deposit a layer of material on the substrate.
Public/Granted literature
- US08877300B2 Atomic layer deposition using radicals of gas mixture Public/Granted day:2014-11-04
Information query
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