发明申请
- 专利标题： MITIGATING THE EFFECTS OF DEFECTS IN HIGH TEMPERATURE SUPERCONDUCTOR WIRES
- 专利标题（中）： 缓解缺陷在高温超导线中的影响
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申请号： US13414811申请日： 2012-03-08
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公开(公告)号： US20120245035A1公开(公告)日： 2012-09-27
- 发明人: Eric R. Podtburg , Henry C. Valcour, III , Subramaniam Anandakugan , Peter D. Antaya , William L. Carter , John Gannon , Hong Cai , Michael A. Tanner , David Crotzer , Alexander Otto , Dana Krause
- 申请人： Eric R. Podtburg , Henry C. Valcour, III , Subramaniam Anandakugan , Peter D. Antaya , William L. Carter , John Gannon , Hong Cai , Michael A. Tanner , David Crotzer , Alexander Otto , Dana Krause
- 申请人地址： US MA Devens
- 专利权人： American Superconductor Corporation
- 当前专利权人： American Superconductor Corporation
- 当前专利权人地址： US MA Devens
- 主分类号： H01B13/00
- IPC分类号： H01B13/00 ; B32B43/00
摘要：
A method includes locating a defect in a first segment of high temperature superconducting wire. A second segment of high temperature superconducting wire is then positioned onto the first segment of high temperature superconducting wire such that the second segment of high temperature superconducting wire overlaps the defect. A path is then created such that current flows through the second segment of high temperature superconducting wire. The first segment of high temperature superconducting wire and second segment of high temperature superconducting wire are then laminated together.
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