发明申请
- 专利标题: ION ENERGY ANALYZER AND METHODS OF MANUFACTURING THE SAME
- 专利标题(中): 离子能分析仪及其制造方法
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申请号: US13433088申请日: 2012-03-28
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公开(公告)号: US20120248311A1公开(公告)日: 2012-10-04
- 发明人: Merritt Funk , Lee Chen , Barton Lane , Jianping Zhao , Radha Sundararajan
- 申请人: Merritt Funk , Lee Chen , Barton Lane , Jianping Zhao , Radha Sundararajan
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 主分类号: G01T1/16
- IPC分类号: G01T1/16 ; B23K31/02 ; H01S4/00
摘要:
A process by which an ion energy analyzer is manufactured includes processing a first substrate to form an entrance grid having a first channel and a first plurality of openings extending therethrough. A second substrate is processed to form a selection grid having a second channel therein and a second plurality of openings extending therethrough. A third substrate is processed to form an ion collector having a third channel therein. The entrance grid is operably coupled to, and electrically isolated from, the selection grid, which is, in turn, operably coupled to, and electrically isolated from, the ion collector.
公开/授权文献
- US08816281B2 Ion energy analyzer and methods of manufacturing the same 公开/授权日:2014-08-26
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