发明申请
- 专利标题: LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
- 专利标题(中): LITHOGRAPHIC装置和装置制造方法
-
申请号: US13543613申请日: 2012-07-06
-
公开(公告)号: US20120274912A1公开(公告)日: 2012-11-01
- 发明人: Marcus Adrianus VAN DE KERKHOF , Siebe Landheer , Marcel Beckers , Jeroen Peter Johannes Bruijstens , Ivo Adam Johannes Thomas , Franciscus Johannes Joseph Janssen
- 申请人: Marcus Adrianus VAN DE KERKHOF , Siebe Landheer , Marcel Beckers , Jeroen Peter Johannes Bruijstens , Ivo Adam Johannes Thomas , Franciscus Johannes Joseph Janssen
- 申请人地址: NL Veldhoven
- 专利权人: ASML NETHERLANDS B.V.
- 当前专利权人: ASML NETHERLANDS B.V.
- 当前专利权人地址: NL Veldhoven
- 主分类号: G03B27/52
- IPC分类号: G03B27/52
摘要:
A lithographic apparatus includes a projection system configured to project a patterned radiation beam onto a target portion of a substrate. The projection system has a final element. The apparatus also includes a barrier member surrounding a space between the projection system and, in use, the substrate, to define in part with the final element a reservoir for liquid. The barrier member is spaced from the final element to define a gap therebetween. The apparatus further includes a deformable seal between a radially outer surface of the final element and a radially outer surface of the barrier member. The deformable seal is configured to substantially prevent a gas from flowing past the seal towards or away from the reservoir of liquid.
公开/授权文献
- US09182678B2 Lithographic apparatus and device manufacturing method 公开/授权日:2015-11-10
信息查询