发明申请
US20130021601A1 ABNORMAL MEASUREMENT DETECTION DEVICE AND METHOD FOR INFRARED RADIATION THERMOMETER
审中-公开
用于红外辐射温度计的异常测量装置和方法
- 专利标题： ABNORMAL MEASUREMENT DETECTION DEVICE AND METHOD FOR INFRARED RADIATION THERMOMETER
- 专利标题（中）： 用于红外辐射温度计的异常测量装置和方法
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申请号： US13567866申请日： 2012-08-06
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公开(公告)号： US20130021601A1公开(公告)日： 2013-01-24
- 发明人: Yuichi FURUKAWA , Shingo NAKAMURA , Yuji OKADA , Fumio KAWAHARA
- 申请人： Yuichi FURUKAWA , Shingo NAKAMURA , Yuji OKADA , Fumio KAWAHARA
- 申请人地址： JP Toyota-shi JP Toyota-shi
- 专利权人： MEIWA E-TEC CO., LTD.,TOYOTA JIDOSHA KABUSHIKI KAISHA
- 当前专利权人： MEIWA E-TEC CO., LTD.,TOYOTA JIDOSHA KABUSHIKI KAISHA
- 当前专利权人地址： JP Toyota-shi JP Toyota-shi
- 优先权： JP2007-094131 20070330
- 主分类号： G01N21/00
- IPC分类号： G01N21/00
摘要：
A technique for an infrared radiation thermometer used for theiniography that detects measurement abnormality of an infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.
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