专利检索 ap:("Yuichi FURUKAWA" OR "Shingo NAKAMURA" OR "Yuji OKADA" OR "Fumio KAWAHARA") AND inv:"Shingo NAKAMURA" 第 1 页

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发明申请
ABNORMAL MEASUREMENT DETECTION DEVICE AND METHOD FOR INFRARED RADIATION THERMOMETER 审中-公开
标题翻译：用于红外辐射温度计的异常测量装置和方法

公开(公告)号：US20130021601A1

公开(公告)日：2013-01-24

申请号：US13567866

申请日：2012-08-06

申请人： Yuichi FURUKAWA , Shingo NAKAMURA , Yuji OKADA , Fumio KAWAHARA

发明人： Yuichi FURUKAWA , Shingo NAKAMURA , Yuji OKADA , Fumio KAWAHARA

IPC分类号： G01N21/00

CPC分类号： G01J5/0003 , G01J5/004 , G01J5/0044 , G01J5/02 , G01J5/026 , G01J5/04 , G01J5/043 , G01J5/08 , G01J5/0803 , G01J5/0846 , G01J5/0859 , G01J5/12 , G01J5/522 , G01J2005/0077 , G01J2005/0081

摘要： A technique for an infrared radiation thermometer used for theiniography that detects measurement abnormality of an infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.

摘要翻译： 用于红外辐射温度计的红外线辐射温度计技术，用于检测红外线辐射温度计的测量异常，并估计红外辐射温度计的机构部分中的物镜的污染和误差等测量异常的原因。