发明申请
- 专利标题: METHOD AND CIRCUITRY FOR DEBUGGING A POWER-GATED CIRCUIT
- 专利标题(中): 用于调试功率门控电路的方法和电路
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申请号: US13184982申请日: 2011-07-18
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公开(公告)号: US20130024829A1公开(公告)日: 2013-01-24
- 发明人: Benjamin Tsien , Kiran Bondalapati , Hao Huang , William A. Hughes , Eric Rentschler , Jeremy Schreiber , Aaron J. Grenat
- 申请人: Benjamin Tsien , Kiran Bondalapati , Hao Huang , William A. Hughes , Eric Rentschler , Jeremy Schreiber , Aaron J. Grenat
- 申请人地址: US CA Sunnyvale
- 专利权人: ADVANCED MICRO DEVICES, INC.
- 当前专利权人: ADVANCED MICRO DEVICES, INC.
- 当前专利权人地址: US CA Sunnyvale
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Described are a circuit and a method of analyzing and correcting a fault occurring in operation of the circuit during a power gating sequence. The method includes executing a modification of the power gating sequence that includes maintaining operation of a trace capture buffer (TCB); recording, in the TCB, events occurring during the executing; and correcting the fault based on analysis of the events recorded in the TCB. The circuit includes a plurality of components including a TCB, and a switch configured to maintain power to the TCB in a first state and turn off power to the TCB in a second state.
公开/授权文献
- US08595563B2 Method and circuitry for debugging a power-gated circuit 公开/授权日:2013-11-26
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