发明申请
- 专利标题: SYSTEMATIC, NORMALIZED METRIC FOR ANALYZING AND COMPARING OPTIMIZATION TECHNIQUES FOR INTEGRATED CIRCUITS EMPLOYING VOLTAGE SCALING AND INTEGRATED CIRCUITS DESIGNED THEREBY
- 专利标题(中): 用于分析和比较采用电压调节的集成电路和集成电路的优化方法的系统,正则化公制
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申请号: US13599549申请日: 2012-08-30
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公开(公告)号: US20130055175A1公开(公告)日: 2013-02-28
- 发明人: Joseph J. Jamann , James C. Parker , Vishwas M. Rao
- 申请人: Joseph J. Jamann , James C. Parker , Vishwas M. Rao
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Various embodiments of methods of designing an integrated circuit (IC) are provided herein. One embodiment of one such method includes: (1) generating a functional IC design, (2) determining a target clock rate for the functional IC design, (3) generating a netlist from the functional IC design that meets the target clock rate, (4) determining a unitless performance/power quantifier from the netlist, (5) attempting to increase the unitless performance/power quantifier by changing at least one of a speed, an area and a power consumption in at least some noncritical paths in the netlist, wherein the attempting is performed by a processor and (6) generating a layout of the IC from the netlist.
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