发明申请
- 专利标题: NON-CONTACT TESTING OF PRINTED ELECTRONICS
- 专利标题(中): 印刷电子非接触测试
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申请号: US13744841申请日: 2013-01-18
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公开(公告)号: US20130127487A1公开(公告)日: 2013-05-23
- 发明人: Robert Addison Boudreau , Douglas Edward Brackley , Kevin Thomas Gahagan , Gary Edward Merz , Leon Robert Zoeller, III
- 申请人: Robert Addison Boudreau , Douglas Edward Brackley , Kevin Thomas Gahagan , Gary Edward Merz , Leon Robert Zoeller, III
- 主分类号: G01R31/309
- IPC分类号: G01R31/309
摘要:
Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.
公开/授权文献
- US09360519B2 Non-contact testing of printed electronics 公开/授权日:2016-06-07
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