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6 条记录 (耗时 0.032 秒)

    NON-CONTACT TESTING OF PRINTED ELECTRONICS
    1.
    发明申请
    NON-CONTACT TESTING OF PRINTED ELECTRONICS 审中-公开
    印刷电子非接触测试

    公开(公告)号：US20130127487A1

    公开(公告)日：2013-05-23

    申请号：US13744841

    申请日：2013-01-18

    申请人： Robert Addison Boudreau ,  Douglas Edward Brackley ,  Kevin Thomas Gahagan ,  Gary Edward Merz ,  Leon Robert Zoeller, III

    发明人： Robert Addison Boudreau ,  Douglas Edward Brackley ,  Kevin Thomas Gahagan ,  Gary Edward Merz ,  Leon Robert Zoeller, III

    IPC分类号： G01R31/309

    CPC分类号： G01R31/309 ,  G01R31/2808 ,  G01R31/2812 ,  G01R31/304

    摘要： Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.

    摘要翻译： 提供了印刷在基板（3）上的电子部件的非接触测试的装置和方法。 测试电路（11）与期望的电子部件同时印刷在基板（3）上。 测试电路（11）都是光学的，并且包括用于为测试电路（11）提供电能的第一部分（13）和用于产生可检测光信号的第二部分（15），该第二部分指示至少一个电气特性 的电子元件。 测试电路实时使用，并在打印诸如ePaper的产品中最小化不可用废料的生产。

    Non-contact testing of printed electronics
    2.
    发明授权
    Non-contact testing of printed electronics 有权
    印刷电子学非接触式测试

    公开(公告)号：US08378702B2

    公开(公告)日：2013-02-19

    申请号：US12437779

    申请日：2009-05-08

    申请人： Robert Addison Boudreau ,  Douglas Edward Brackley ,  Kevin Thomas Gahagan ,  Gary Edward Merz ,  Leon Robert Zoeller, III

    发明人： Robert Addison Boudreau ,  Douglas Edward Brackley ,  Kevin Thomas Gahagan ,  Gary Edward Merz ,  Leon Robert Zoeller, III

    IPC分类号： G01R31/308

    CPC分类号： G01R31/309 ,  G01R31/2808 ,  G01R31/2812 ,  G01R31/304

    摘要： Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.

    摘要翻译： 提供了印刷在基板（3）上的电子部件的非接触测试的装置和方法。 测试电路（11）与期望的电子部件同时印刷在基板（3）上。 测试电路（11）都是光学的，并且包括用于为测试电路（11）提供电能的第一部分（13）和用于产生可检测光信号的第二部分（15），该第二部分指示至少一个电气特性 的电子元件。 测试电路实时使用，并在打印诸如ePaper的产品中最小化不可用废料的生产。

    NON-CONTACT TESTING OF PRINTED ELECTRONICS
    3.
    发明申请
    NON-CONTACT TESTING OF PRINTED ELECTRONICS 有权
    印刷电子非接触测试

    公开(公告)号：US20100283499A1

    公开(公告)日：2010-11-11

    申请号：US12437779

    申请日：2009-05-08

    申请人： Robert Addison Bourdreau ,  Douglas Edward Brackley ,  Kevin Thomas Gahagan ,  Gary Edward Merz ,  Leon Robert Zoeller, III

    发明人： Robert Addison Bourdreau ,  Douglas Edward Brackley ,  Kevin Thomas Gahagan ,  Gary Edward Merz ,  Leon Robert Zoeller, III

    IPC分类号： G01R31/26 ,  B41C1/04

    CPC分类号： G01R31/309 ,  G01R31/2808 ,  G01R31/2812 ,  G01R31/304

    摘要： Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.

    摘要翻译： 提供了印刷在基板（3）上的电子部件的非接触测试的装置和方法。 测试电路（11）与期望的电子部件同时印刷在基板（3）上。 测试电路（11）都是光学的，并且包括用于为测试电路（11）提供电能的第一部分（13）和用于产生可检测光信号的第二部分（15），该第二部分指示至少一个电气特性 的电子元件。 测试电路实时使用，并在打印诸如ePaper的产品中最小化不可用废料的生产。

    Semiconductor laser and tunable fluid lenses
    4.
    发明申请
    Semiconductor laser and tunable fluid lenses 审中-公开
    半导体激光和可调流体透镜

    公开(公告)号：US20080063022A1

    公开(公告)日：2008-03-13

    申请号：US11519669

    申请日：2006-09-12

    申请人： Kevin Thomas Gahagan ,  Jacques Gollier ,  James Scott Sutherland

    发明人： Kevin Thomas Gahagan ,  Jacques Gollier ,  James Scott Sutherland

    IPC分类号： H01S3/08

    CPC分类号： G02B3/14 ,  G02B6/4206 ,  G02F1/37 ,  H01S5/005

    摘要： According to one aspect of the present invention, a semiconductor laser comprising a laser chip, a light wavelength conversion device, and a tunable lens according to the present invention is provided. The tunable lens comprises first and second fluid lens components positioned to direct light from the laser chip to the light wavelength conversion device. The first and second fluid lens components are oriented and configured such that the first and second longitudinal tuning axes defined by the lens components are skewed relative to each other and such that the respective curvatures of the lens surfaces of each lens component are variable. In accordance with another embodiment of the present invention, a tunable lens is provided comprising the first and second fluid lens components. Additional embodiments are disclosed.

    摘要翻译： 根据本发明的一个方面，提供了包括根据本发明的激光芯片，光波长转换装置和可调透镜的半导体激光器。 可调透镜包括定位成将来自激光芯片的光引导到光波长转换装置的第一和第二流体透镜部件。 第一和第二流体透镜部件被定向和配置为使得由透镜部件限定的第一和第二纵向调谐轴线相对于彼此倾斜，并且使得每个透镜部件的透镜表面的相应曲率是可变的。 根据本发明的另一实施例，提供了包括第一和第二流体透镜部件的可调透镜。 公开了另外的实施例。