- 专利标题: METHOD FOR FABRICATING SCHOTTKY DEVICE
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申请号: US13338256申请日: 2011-12-28
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公开(公告)号: US20130130485A1公开(公告)日: 2013-05-23
- 发明人: Yung-Fa Lin , Shou-Yi Hsu , Meng-Wei Wu , Main-Gwo Chen , Chia-Hao Chang , Chia-Wei Chen
- 申请人: Yung-Fa Lin , Shou-Yi Hsu , Meng-Wei Wu , Main-Gwo Chen , Chia-Hao Chang , Chia-Wei Chen
- 优先权: TW100142440 20111118
- 主分类号: H01L21/329
- IPC分类号: H01L21/329
摘要:
A method for fabricating a Schottky device includes the following sequences. First, a substrate with a first conductivity type is provided and an epitaxial layer with the first conductivity type is grown on the substrate. Then, a patterned dielectric layer is formed on the epitaxial layer, and a metal silicide layer is formed on a surface of the epitaxial layer. A dopant source layer with a second conductivity type is formed on the metal silicide layer, followed by applying a thermal drive-in process to diffuse the dopants inside the dopant source layer into the epitaxial layer. Finally, a conductive layer is formed on the metal silicide layer.
公开/授权文献
- US08466051B2 Method for fabricating Schottky device 公开/授权日:2013-06-18
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