Invention Application
US20130250306A1 METHOD FOR EVALUATING CHARACTERISTICS OF OPTICAL MODULATOR HAVING MACH-ZEHNDER INTERFEROMETERS
有权
具有MACH-ZEHNDER干涉仪的光学调制器特性评估方法
- Patent Title: METHOD FOR EVALUATING CHARACTERISTICS OF OPTICAL MODULATOR HAVING MACH-ZEHNDER INTERFEROMETERS
- Patent Title (中): 具有MACH-ZEHNDER干涉仪的光学调制器特性评估方法
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Application No.: US13845393Application Date: 2013-03-18
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Publication No.: US20130250306A1Publication Date: 2013-09-26
- Inventor: Tetsuya KAWANISHI , Shinya NAKAJIMA , Satoshi SHINADA
- Applicant: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
- Applicant Address: JP Tokyo
- Assignee: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
- Current Assignee: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
- Current Assignee Address: JP Tokyo
- Priority: JPPCT/JP2008/000575 20080313
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
PROBLEMSTo provide a method for evaluating characteristics of MZ interferometers in an optical modulator having a plurality of MZ interferometers.MEANS FOR SOLVING PROBLEMSWhen an optical modulator includes a plurality of MZ interferometers, the 0-degree component contains a signal derived from an MZ interferometer other than the MZ interferometers for evaluating the characteristic. For this, it is impossible to accurately evaluate the characteristic of the MZ interferometers. The present invention does not use the 0-degree component normally having the highest intensity. That is, the characteristic of the MZ interferometers are evaluated by using a side band intensity of the component other than the 0-degree component.
Public/Granted literature
- US08693005B2 Method for evaluating characteristics of optical modulator having Mach-Zehnder interferometers Public/Granted day:2014-04-08
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