公开(公告)号：US20130250306A1

公开(公告)日：2013-09-26

申请号：US13845393

申请日：2013-03-18

Applicant: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY

Inventor： Tetsuya KAWANISHI ,  Shinya NAKAJIMA ,  Satoshi SHINADA

IPC: G01B9/02

CPC classification number: G01B9/02 ,  G01M11/00 ,  G02F1/2255 ,  G02F2001/212 ,  G02F2201/18 ,  G02F2203/25 ,  G02F2203/69

Abstract: PROBLEMSTo provide a method for evaluating characteristics of MZ interferometers in an optical modulator having a plurality of MZ interferometers.MEANS FOR SOLVING PROBLEMSWhen an optical modulator includes a plurality of MZ interferometers, the 0-degree component contains a signal derived from an MZ interferometer other than the MZ interferometers for evaluating the characteristic. For this, it is impossible to accurately evaluate the characteristic of the MZ interferometers. The present invention does not use the 0-degree component normally having the highest intensity. That is, the characteristic of the MZ interferometers are evaluated by using a side band intensity of the component other than the 0-degree component.

Abstract translation: 问题提供一种用于评估具有多个MZ干涉仪的光调制器中的MZ干涉仪的特性的方法。 解决问题的手段当光调制器包括多个MZ干涉仪时，0度分量包含从用于评估特性的MZ干涉仪以外的MZ干涉仪导出的信号。 为此，不可能准确地评估MZ干涉仪的特性。 本发明不使用通常具有最高强度的0度组分。 也就是说，通过使用除了0度分量之外的分量的边带强度来评估MZ干涉仪的特性。