发明申请
- 专利标题: INTERLAYER INTERCONNECTS AND ASSOCIATED TECHNIQUES AND CONFIGURATIONS
- 专利标题(中): 中间层互连及相关技术和配置
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申请号: US13560930申请日: 2012-07-27
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公开(公告)号: US20140029181A1公开(公告)日: 2014-01-30
- 发明人: Florian Gstrein , Hui Jae Yoo , Jacob M. Faber , James S. Clarke
- 申请人: Florian Gstrein , Hui Jae Yoo , Jacob M. Faber , James S. Clarke
- 主分类号: H01L23/522
- IPC分类号: H01L23/522 ; G06F1/16 ; H01L21/768
摘要:
Embodiments of the present disclosure are directed towards interlayer interconnects and associated techniques and configurations. In one embodiment, an apparatus includes a semiconductor substrate, one or more device layers disposed on the semiconductor substrate, and one or more interconnect layers disposed on the one or more device layers, the one or more interconnect layers including interconnect structures configured to route electrical signals to or from the one or more device layers, the interconnect structures comprising copper (Cu) and germanium (Ge). Other embodiments may be described and/or claimed.
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