发明申请
- 专利标题: SYSTEMS AND METHODS FOR MEASURING SHEET RESISTANCE
- 专利标题(中): 用于测量表面电阻的系统和方法
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申请号: US13601762申请日: 2012-08-31
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公开(公告)号: US20140062845A1公开(公告)日: 2014-03-06
- 发明人: Kingsuk Brahma , Saman Saeedi , Sang Y. Youn , Shafiq M. Jamal , Taif A. Syed
- 申请人: Kingsuk Brahma , Saman Saeedi , Sang Y. Youn , Shafiq M. Jamal , Taif A. Syed
- 申请人地址: US CA Cupertino
- 专利权人: APPLE INC.
- 当前专利权人: APPLE INC.
- 当前专利权人地址: US CA Cupertino
- 主分类号: G01N27/04
- IPC分类号: G01N27/04 ; G09G3/36 ; G06F17/00
摘要:
The present disclosure is directed to systems and methods for determining sheet resistance values in a liquid crystal display (LCD) panel. In certain embodiments, a system for determining sheet resistance values in an LCD panel may include a display driver integrated circuit (IC). The display driver IC may include a first switch coupled to a first input/output (I/O) pad and a second I/O pad such that the first I/O pad is configured to couple to a voltage source and the second I/O pad is configured to couple to a current source. The display driver IC may also include a second switch coupled to a third I/O pad and the second I/O pa such that the second switch has substantially the same geometry as the first switch and the third I/O pad is configured to couple to a thin-film transistor (TFT) layer of the display panel.
公开/授权文献
- US08970464B2 Systems and methods for measuring sheet resistance 公开/授权日:2015-03-03
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