发明申请
US20140072102A1 SOURCE OF X-RAYS GENERATING A BEAM OF NANOMETRIC SIZE AND IMAGING DEVICE COMPRISING AT LEAST ONE SUCH SOURCE
有权
X射线源产生一个纳米尺寸的光束和包含至少一个这样的源的成像装置
- 专利标题： SOURCE OF X-RAYS GENERATING A BEAM OF NANOMETRIC SIZE AND IMAGING DEVICE COMPRISING AT LEAST ONE SUCH SOURCE
- 专利标题（中）： X射线源产生一个纳米尺寸的光束和包含至少一个这样的源的成像装置
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申请号： US14021367申请日： 2013-09-09
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公开(公告)号： US20140072102A1公开(公告)日： 2014-03-13
- 发明人: Pierre BLEUET , Nicolas Martin
- 申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT
- 申请人地址： FR Paris
- 专利权人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT
- 当前专利权人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE ALT
- 当前专利权人地址： FR Paris
- 优先权： FR1258446 20120910
- 主分类号： H01J35/04
- IPC分类号： H01J35/04 ; G01N23/04
摘要：
Source of X-rays comprising a source of electrons generating an electron beam of nanometric size and a target, the target being designed to send out an X-ray beam by illumination by the electron beam, the target comprising one nanowire, for example made of silicon, and a nanowire catalyst, for example made of gold, covering the free end of the nanowire.
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