Invention Application
- Patent Title: STATIC-ELECTRICITY-QUANTITY MEASURING APPARATUS AND STATIC-ELECTRICITY- QUANTITY MEASURING METHOD
- Patent Title (中): 静态电量测量装置和静态电量测量方法
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Application No.: US14118778Application Date: 2012-04-11
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Publication No.: US20140091806A1Publication Date: 2014-04-03
- Inventor: Kazuya Kikunaga , Kazuhiro Nonaka
- Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Applicant Address: JP Tokyo
- Assignee: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee Address: JP Tokyo
- Priority: JP2011-136195 20110620
- International Application: PCT/JP2012/059858 WO 20120411
- Main IPC: G01R29/12
- IPC: G01R29/12

Abstract:
A static-electricity-quantity measuring apparatus and a static-electricity-quantity measuring method are optimum for a manufacturing site under a difficult-to-measure situation and measure the quantity of static electricity of electronic parts, machine parts, etc. simply with high accuracy. A static-electricity-quantity measuring apparatus of the present invention has: a receiving unit which receives virtual electromagnetic waves generated by vibrations applied to a measured object; a measuring unit which measures at least one of the intensity, frequency, and phase of the virtual electromagnetic waves received by the receiving unit; and a calculating unit which calculates the quantity of static electricity of the measured object based on the measurement result of the measuring unit.
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