Invention Application
US20140118165A1 METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STABILITY
审中-公开
方法，测量雪花结构和稳定性的装置和系统
- Patent Title: METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STABILITY
- Patent Title (中): 方法，测量雪花结构和稳定性的装置和系统
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Application No.: US14063959Application Date: 2013-10-25
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Publication No.: US20140118165A1Publication Date: 2014-05-01
- Inventor: James Loren CHRISTIAN , Samuel Tileston WHITTEMORE , Brinton J.W. MARKLE
- Applicant: AvaTech, Inc.
- Applicant Address: US MA Cambridge
- Assignee: AVATECH, INC.
- Current Assignee: AVATECH, INC.
- Current Assignee Address: US MA Cambridge
- Main IPC: G08C17/02
- IPC: G08C17/02 ; G01B7/26
Abstract:
The present inventions relate generally to methods, apparatus and systems for sharing measurements related to snow stability and structure which may be used to assess avalanche risk among multiple users. Such measurements may include a profile of snow layer hardness according to depth, a profile of snow temperature according to depth, a profile of snow grain size according to depth, ambient temperature, slope aspect and inclination, and humidity. The disclosed apparatus includes a mobile device configured to send and receive said measurements, and to display such measurements on an area map. The disclosed apparatus also includes a server configured to receive said measurements from a plurality of mobile devices, analyze the measurements to evaluate the avalanche risk at a geographic area, and transmit said measurements and evaluated avalanche risk to the mobile devices.
Information query
