发明申请
US20140151553A1 CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR INSPECTING OR OBSERVING SAMPLE
有权
充电颗粒光束装置,用于调整充电颗粒光束装置的方法,以及用于检查或观察样品的方法
- 专利标题: CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR INSPECTING OR OBSERVING SAMPLE
- 专利标题(中): 充电颗粒光束装置,用于调整充电颗粒光束装置的方法,以及用于检查或观察样品的方法
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申请号: US14235892申请日: 2012-07-04
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公开(公告)号: US20140151553A1公开(公告)日: 2014-06-05
- 发明人: Yusuke Ominami , Tomohisa Ohtaki , Sukehiro Ito
- 申请人: Yusuke Ominami , Tomohisa Ohtaki , Sukehiro Ito
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2011-205499 20110921
- 国际申请: PCT/JP2012/067035 WO 20120704
- 主分类号: H01J37/06
- IPC分类号: H01J37/06
摘要:
A charged particle beam device capable of observing a sample in an air atmosphere or gas atmosphere has a thin film for separating the atmospheric pressure space from the decompressed space. A vacuum evacuation pump evacuates a first housing; and a detector detects a charged particle beam (obtained by irradiation of the sample) in the first housing. A thin film is provided to separate the inside of the first housing and the inside of a second housing at least along part of the interface between the first and second housings. An opening part is formed in the thin film so that its opening area on a charged particle irradiation unit's side is larger than its opening area on the sample side; and the thin film which covers the sample side of the opening part transmits or allows through the primary charged particle beam and the charged particle beam.
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