发明申请
US20140159764A1 SYSTEMS AND METHODS FOR FRACTURE DETECTION IN AN INTEGRATED CIRCUIT
审中-公开
用于集成电路中断裂检测的系统和方法
- 专利标题: SYSTEMS AND METHODS FOR FRACTURE DETECTION IN AN INTEGRATED CIRCUIT
- 专利标题(中): 用于集成电路中断裂检测的系统和方法
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申请号: US13712628申请日: 2012-12-12
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公开(公告)号: US20140159764A1公开(公告)日: 2014-06-12
- 发明人: Ahmad Al-Dahle , Joshua G. Wurzel , Yafei Bi
- 申请人: APPLE INC.
- 申请人地址: US CA Cupertino
- 专利权人: APPLE INC.
- 当前专利权人: APPLE INC.
- 当前专利权人地址: US CA Cupertino
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
摘要:
Systems, methods, and devices are provided to identify the occurrence, location, and/or severity of a fracture within an integrated circuit, even when the integrated circuit is not accessible to external inspection. One such method includes obtaining a measurement of a property of the integrated circuit through at least one contact of the integrated circuit. The measurement may include a resistance of a resistive pattern in the integrated circuit or a measurement of current-voltage behavior of a power supply of the integrated circuit. The measurement of the property may be compared to an expected baseline property. Based at least in part on this comparison, whether a fracture of the integrated circuit has occurred and a location of the fracture in the integrated circuit may be determined.