发明申请
US20140377933A1 METHOD FOR PRODUCING A METAL STRUCTURE IN A SEMICONDUCTOR SUBSTRATE 有权
在半导体衬底中生产金属结构的方法

  • 专利标题: METHOD FOR PRODUCING A METAL STRUCTURE IN A SEMICONDUCTOR SUBSTRATE
  • 专利标题(中): 在半导体衬底中生产金属结构的方法
  • 申请号: US14306164
    申请日: 2014-06-16
  • 公开(公告)号: US20140377933A1
    公开(公告)日: 2014-12-25
  • 发明人: Heribert WEBER
  • 申请人: Heribert WEBER
  • 申请人地址: DE Stuttgart
  • 专利权人: ROBERT BOSCH GMBH
  • 当前专利权人: ROBERT BOSCH GMBH
  • 当前专利权人地址: DE Stuttgart
  • 优先权: DE102013211562.8 20130619
  • 主分类号: H01L49/02
  • IPC分类号: H01L49/02
METHOD FOR PRODUCING A METAL STRUCTURE IN A SEMICONDUCTOR SUBSTRATE
摘要:
A method for producing a metal structure in a semiconductor substrate includes: producing an opening in the rear side of the semiconductor substrate in the area of the metal structure to be produced, which extends to the front side layer structure; filling the opening at least partially with a metal so that a metal structure is created which extends from the rear side of the semiconductor substrate to the front side layer structure; masking the rear side of the semiconductor substrate for a trench process for exposing the metal structure in such a way that the trench mask includes a lattice structure in an area adjacent to the metal structure; producing an isolation trench adjacent to the metal structure, the metal structure acting as a lateral etch stop and the lattice structure being laterally undercut in the trench mask; and applying a sealing layer to the mask.
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